P75-A2 Cupped Head Spring Test Probe Pogo Pin (PCB Testing Probe)

The P75-A2 Cupped Head Spring Test Probe Pogo Pin is a spring-loaded electrical contact designed for PCB testing, electronic test fixtures, programming jigs, and component inspection applications. Its cupped head tip helps provide stable contact with component leads, terminals, pads, and other test points during repeated electrical testing.

Key Features -

• P75-A2 spring-loaded test probe

• Cupped head contact tip

• Spring-loaded pogo pin mechanism

• Reliable temporary electrical contact

• Suitable for repeated testing cycles

• Helps maintain stable contact with test points

• Compact probe construction

• Suitable for PCB test fixtures and jigs

Specifications -

• Product Type: Spring Test Probe Pogo Pin

• Model: P75-A2

• Probe Series: P75

• Tip Type: Cupped Head

• Contact Type: Spring Loaded

• Connector Type: Electrical Test Probe

• Mounting Type: Test Fixture / Probe Socket Mount

• Contact Material: Conductive Metal Alloy

• Application Type: Temporary Electrical Contact

• Additional Features: Spring-loaded movement, stable test-point contact, reusable probe design, suitable for automated and manual testing fixtures

Applications -

• PCB functional testing

• Printed circuit board inspection

• In-circuit testing

• Programming and flashing jigs

• Electronic test fixtures

• Component testing

• Production line testing

• DIY electronics test setups