P75-B1 Spring Test Probe Pogo Pin Cusp Spear Head 1.02mm Diameter (PCB Test Probe)

The P75-B1 Spring Test Probe is a precision spring-loaded pogo pin featuring a cusp spear head tip and 1.02mm body diameter, designed for reliable temporary electrical contact during PCB testing, programming, in-circuit testing, and automated production applications. The sharp spear head tip is ideal for penetrating light oxidation or contamination on test pads, ensuring stable and accurate electrical contact.

Its precision spring mechanism provides consistent contact force, making it suitable for repeated test cycles in electronic manufacturing and quality inspection.

Key Features -

• P75-B1 spring-loaded test probe

• Cusp spear head contact tip

• 1.02mm body diameter

• Reliable low-resistance electrical contact

• Precision spring-loaded mechanism

• Suitable for repeated test cycles

• Ideal for PCB testing and programming fixtures

Specifications -

• Product Type: Spring Test Probe (Pogo Pin)

• Model: P75-B1

• Body Diameter: 1.02mm

• Tip Style: Cusp Spear Head

• Contact Type: Spring Loaded

• Mounting Type: Through-Hole / Test Fixture Mount

• Contact Material: Gold-Plated Copper Alloy (Application Dependent)

• Spring Material: Stainless Steel

• Housing Material: Precision Metal Alloy

• Application: PCB Testing, Programming and Electrical Contact

Applications -

• PCB test fixtures

• In-circuit testing (ICT)

• Functional testing systems

• Programming fixtures

• Electronic production testing

• Quality inspection equipment

• Battery charging contacts

• Prototype development