P75-E3 Spring Test Probe Pogo Pin 1.02mm Diameter (PCB Test Probe)

The P75-E3 Spring Test Probe is a precision spring-loaded pogo pin with a 1.02mm body diameter, designed for reliable temporary electrical contact during PCB testing, programming, charging, and automated test applications. Its spring-loaded mechanism provides consistent contact pressure, ensuring accurate signal transmission and dependable performance through repeated test cycles.

The robust construction and precision spring design make it suitable for electronic manufacturing, in-circuit testing (ICT), functional testing, and custom test fixtures.

Key Features -

• P75-E3 spring-loaded test probe

• 1.02mm body diameter

• Reliable low-resistance electrical contact

• Precision spring-loaded design

• Suitable for repeated test cycles

• Durable and wear-resistant construction

• Ideal for PCB testing and programming fixtures

Specifications -

• Product Type: Spring Test Probe (Pogo Pin)

• Model: P75-E3

• Body Diameter: 1.02mm

• Contact Type: Spring Loaded

• Mounting Type: Through-Hole / Test Fixture Mount

• Contact Material: Gold-Plated Copper Alloy (Application Dependent)

• Spring Material: Stainless Steel

• Housing Material: Precision Metal Alloy

• Application: PCB Testing, Programming and Electrical Contact

Applications -

• PCB test fixtures

• In-circuit testing (ICT)

• Functional testing systems

• Programming fixtures

• Battery charging contacts

• Electronic production testing

• Quality inspection equipment

• Prototype development